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488/561 nm lasers BrightLine® dual-edge super-resolution / TIRF dichroic beamsplitter

Part Number: Di03-R488/561-t1-25x36

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  • Your filter spectrum may differ slightly from the typical spectrum above, but is certified to meet the optical specifications noted below.
Semrock Optical Filter: Di03-R488/561  Di03  R488/561
488/561 nm lasers BrightLine® dual-edge super-resolution / TIRF dichroic beamsplitter
The perfect beamsplitters for the most popular lasers used in fluorescence imaging, including all-solid-state lasers. All beamsplitters in this category have exceptional reflectance at the key laser wavelengths, and wider reflection bands — into UV for photoactivation and super-resolution techniques. Additionally they feature extended transmission regions — into IR to 1200 or 1600 nm, and anti-reflection (AR) coatings to minimize imaging artifacts resulting from the coherent laser light.

Semrock's super-resolution / TIRF dichroics are available in two thicknesses and deliver industry-leading flatness for minimal focus shift and optical wavefront aberrations of the laser beam spot to enable popular imaging and Super-resolution techniques such as TIRF, PALM, STORM, Structured Illumination, and STED.

1λ P-V RWE on 1 mm, optimized for reflecting laser beams up to 10 mm in diameter while minimizing RWE
λ/5 P-V RWE on 3 mm, optimized for reflecting laser beams up to 22.5 mm in diameter while minimizing RWE
Part NumberSizePrice1Stock StatusQuantity
Di03-R488/561-t1-25x3625.2 mm x 35.6 mm x 1.1 mm
(unmounted)
$545In StockAdd To Cart
Di03-R488/561-t3-25x3625.2 mm x 35.6 mm x 3.0 mm
(unmounted)
$645In StockAdd To Cart

Don’t see a size you need? Create your own custom sized part – available in less than a week.

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Custom Sizing Limits:
Diameter Range: 5mm - 50.8mm
Rectangular Dimensions: 5mm - 55mm

Substrate thickness/tolerance as listed on Specifications tab.
Dimensional tolerances are ±0.1mm for unhoused parts.

For sizes outside the limits listed above, please contact customer service at 1-866-SEMROCK



1) US domestic pricing only. If you are ordering from outside the US, please contact your nearest regional distributor for the correct list price.
Optical Specifications
SpecificationValue
Reflection Band 1Rabs > 94% 471 – 491 nm
Reflection Band 1 (p-pol)Rabs > 90% 471 – 491 nm
Reflection Band 1 (s-pol)Rabs > 98% 471 – 491 nm
Edge Wavelength 1500 nm
Transmission Band 1Tavg > 93% 503.3 – 543 nm
Reflection Band 2Rabs > 94% 559 – 568.2 nm
Reflection Band 2 (p-pol)Rabs > 90% 559 – 568.2 nm
Reflection Band 2 (s-pol)Rabs > 98% 559 – 568.2 nm
Edge Wavelength 2575.5 nm
Transmission Band 2Tavg > 93% 582.4 – 1200 nm
Laser Wavelengths 1473 +/- 2 nm, 488 +3/-2 nm
Laser Wavelengths 2559 +5/-0 nm, 561.4 nm, 568.2 nm

General Filter Specifications
SpecificationValue
Angle of Incidence45 degrees with a shift of 0.35%/degree (40 – 50 degrees)
Cone Half-angle0.5 degrees
Optical Damage Rating1 J/cm² @ 532 nm (10 ns pulse width)
SteepnessSteep
Filter Effective Index2.07 Understanding ‘Effective Index of Refraction’ neff
Flatness / RWE ClassificationSuper-resolution / TIRF
Reflected Wavefront Error (1 mm thickness)< 1λ P-V RWE @ 632.8 nm
Reflected Wavefront Error (3 mm thickness)< 0.2λ P-V RWE @ 632.8 nm

Physical Filter Specifications (applies to standard sized parts; contact us regarding other sizes)
SpecificationValue
Transverse Dimensions (L x W)25.2 mm x 35.6 mm
Transverse Tolerance± 0.1 mm
Filter Thickness (1 mm, unmounted)1.05 mm
Filter Thickness Tolerance (1 mm, unmounted)± 0.05 mm
Filter Thickness (3 mm, unmounted)3.0 mm
Filter Thickness Tolerance (3 mm, unmounted)± 0.1 mm
Clear Aperture≥ 80% (elliptical)
Scratch-Dig60-40
Substrate TypeFused Silica
Substrate Thickness (unmounted)1.05 mm
Substrate Thickness Tolerance (unmounted)± 0.05 mm
Substrate Thickness (3 mm, unmounted)3.0 mm
Substrate Thickness Tolerance (3 mm, unmounted)± 0.1 mm
OrientationReflective surface marked with laser dot - Orient in direction of incoming light

Tech Note
TopicDescription
Cleaning Optical FiltersInstructions for cleaning hard coated optical filters
Filter ReliabilityCompares the performance and reliability of hard coated filters to traditional soft-coated filters and provides information about the testing standards for Semrock filters
Flatness of Dichroic BeamsplittersDescribes the impact of non-flat dichroic beamsplitters on microscope image fidelity
Laser Damage ThresholdProvides information for calculating laser damage threshold for pulsed and continuous wave lasers
Multiband Filter Set TerminologyCompares benefits and drawbacks of full multiband, pinkel and sedat filter sets
Optical Filters for Laser-based Fluorescence MicroscopesDiscusses additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection
Journal Article
TopicDescription
Bringing Super-resolution to Fluorescence MicroscopyPrashant Prabhat, PhD, and Turan Erdogan, PhD, Semrock Inc., BioPhotonics, May/June 2010
Advances in fluorescence microscopy techniques allow users to break the defraction limit and visualize resolution similar to that of an electron microscope
Fluorescence Imaging: Optical filters optimize laser-based fluorescence imaging systemsPrashant Prabhat, PhD, and Turan Erdogan, PhD, Semrock Inc., Laser Focus World, January 2010
Discusses additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection
Perfecting TIRF OpticsPrashant Prabhat, PhD, and Turan Erdogan, PhD, Semrock Inc., BioOptics World, Jan/Feb 2009
Discusses additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection
White Paper
TopicDescription
Optical Filters for Laser-based Fluorescence MicroscopesAnalysis of additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection with a focus on multiple-laser systems.
Flatness of Dichroic Beamsplitters Affects Focus and Image QualityAnalysis of how the radius of curvature of a dichroic filter affects focal plane shift, spot size and image fidelity in fluorescence microscopy.
Super-resolution MicroscopyDiscusses advancements in fluorescence microscopy techniques that allow users to break the defraction limit and visualize resolution similar to that of an electron microscope
Application
TopicDescription
TIRF (Total Internal Reflection Fluorescence)An overview of TIRF microscopy, including solutions from Semrock and additional learning resources.
Laser Scanning/Spinning Disk Confocal MicroscopyAn overview of confocal microscopy techniques and applications, including solutions from Semrock and additional learning resources.
Laser-based InstrumentationAn review of common of laser-based instrumentation, including solutions from Semrock and additional learning resources.

488/561 1/2 Wave 0.5Wave 1/2Wave 1/10 Wave 0.1Wave 1/10Wave Laser Flat Dichroic Beamsplitter Di03-R488/561 Di02-R488/561 R488/561 Laser-Flat Multi-edge Dual Dual-edge Di03-R Super-Resolution TIRF PALM STORM SIM Structured-Illumination structured-illumination-microscopy TIRF-illumination-systems STED P-V Flatness optical-wavefront-distortion reflected-wavefront-distortion Ultra-Flat 1WaveRWE RWE 1/5WaveRWE 1/5Wave 0.2WaveRWE 0.2Wave Di03-R488/561-t1-25x36 Di03-R488/561-t3-25x36

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