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442/488/561 nm Yokogawa dichroic beamsplitter

Part Number: Di01-T442/488/561-13x15x0.5

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  • Your filter spectrum may differ slightly from the typical spectrum above, but is certified to meet the optical specifications noted below.
Optical Specifications
SpecificationValue
Reflection Band 1Ravg > 95% 458 – 478 nm
Edge Wavelength 1442 nm
Transmission Band 1Tavg > 90% 440 – 445 nm
Reflection Band 2Ravg > 95% 503 – 544 nm
Edge Wavelength 2488 nm
Transmission Band 2Tavg > 90% 488 nm
Reflection Band 3Ravg > 95% 578 – 750 nm
Edge Wavelength 3561 nm
Transmission Band 3Tavg > 90% 561 nm

General Filter Specifications
SpecificationValue
Laser Wavelength 1440 – 445 nm
Laser Wavelength 2488 nm
Laser Wavelength 3561 nm
Angle of Incidence45 ± 1.5 degrees
Cone Half-angle0.5 degrees
Optical Damage RatingNot Tested
SteepnessSteep
Filter Effective Index1.94 Understanding ‘Effective Index of Refraction’ neff
Flatness / RWE ClassificationLaser
Reflected Wavefront Error< 6λ P-V RWE @ 632.8 nm

Physical Filter Specifications (applies to standard sized parts; contact us regarding other sizes)
SpecificationValue
Transverse Dimensions (L x W)13.0 mm x 15.0 mm
Transverse Tolerance+ 0.0 / - 0.2 mm
Filter Thickness (unmounted)0.5 mm
Filter Thickness Tolerance (unmounted)± 0.02 mm
Clear Aperture≥ 80% (elliptical)
Scratch-Dig40-20
Substrate TypeFused Silica
Substrate Thickness (unmounted)0.5 mm
Substrate Thickness Tolerance (unmounted)± 0.02 mm
OrientationUnmarked (reflective coating towards sample)

Tech Note
TopicDescription
Cleaning Optical FiltersInstructions for cleaning hard coated optical filters
Filter ReliabilityCompares the performance and reliability of hard coated filters to traditional soft-coated filters and provides information about the testing standards for Semrock filters
Application
TopicDescription
Laser Scanning/Spinning Disk Confocal MicroscopyAn overview of confocal microscopy techniques and applications, including solutions from Semrock and additional learning resources.

Di01-T442/488/561 T442/488/561

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