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405/488/561/710 nm BrightLine® multiphoton quad-edge dichroic beamsplitter

Part Number: Di01-T405/488/561/710-25x36

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  • Your filter spectrum may differ slightly from the typical spectrum above, but is certified to meet the optical specifications noted below.
Optical Specifications
SpecificationValue
Reflection Band 1Ravg > 90% 350 – 386 nm
Edge Wavelength 1392.7 nm
Transmission Band 1Tavg > 90% 398 – 408 nm
Reflection Band 2Ravg > 98% 421 – 455 nm
Edge Wavelength 2463.5 nm
Transmission Band 2Tavg > 90% 470 – 490 nm
Reflection Band 3Ravg > 98% 503 – 545 nm
Edge Wavelength 3553.8 nm
Transmission Band 3Tavg > 90% 561 – 568 nm
Reflection Band 4Ravg > 98% 586 – 680 nm
Edge Wavelength 4700 nm
Transmission Band 4Tavg > 93% 710 – 1600 nm
Laser Wavelengths 1405 +3/-5 nm
Laser Wavelengths 2473 +/- 3 nm, 488 +/- 2 nm
Laser Wavelengths 3561.4 nm, 568.2 nm
Laser Wavelengths 4710 - 1300 nm Ti:Sapphire

General Filter Specifications
SpecificationValue
Angle of Incidence45 ± 1.5 degrees
Cone Half-angle2 degrees
Optical Damage RatingTesting has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hrs.
SteepnessSteep
Filter Effective Index1.74 Understanding ‘Effective Index of Refraction’ neff
Flatness / RWE ClassificationLaser
Reflected Wavefront Error< 6λ P-V RWE @ 632.8 nm

Physical Filter Specifications (applies to standard sized parts; contact us regarding other sizes)
SpecificationValue
Transverse Dimensions (L x W)25.2 mm x 35.6 mm
Transverse Tolerance± 0.1 mm
Filter Thickness (unmounted)1.05 mm
Filter Thickness Tolerance (unmounted)± 0.05 mm
Clear Aperture≥ 80% (elliptical)
Scratch-Dig60-40
Substrate TypeFused Silica
Substrate Thickness (unmounted)1.05 mm
Substrate Thickness Tolerance (unmounted)± 0.05 mm
OrientationReflective surface marked with part number - Orient in direction of incoming light

Tech Note
TopicDescription
Cleaning Optical FiltersInstructions for cleaning hard coated optical filters
Filter ReliabilityCompares the performance and reliability of hard coated filters to traditional soft-coated filters and provides information about the testing standards for Semrock filters
Flatness of Dichroic BeamsplittersDescribes the impact of non-flat dichroic beamsplitters on microscope image fidelity
Laser Damage ThresholdProvides information for calculating laser damage threshold for pulsed and continuous wave lasers
Multiband Filter Set TerminologyCompares benefits and drawbacks of full multiband, pinkel and sedat filter sets
Optical Filters for Laser-based Fluorescence MicroscopesDiscusses additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection
Journal Article
TopicDescription
Bringing Super-resolution to Fluorescence MicroscopyPrashant Prabhat, PhD, and Turan Erdogan, PhD, Semrock Inc., BioPhotonics, May/June 2010
Advances in fluorescence microscopy techniques allow users to break the defraction limit and visualize resolution similar to that of an electron microscope
Fluorescence Imaging: Optical filters optimize laser-based fluorescence imaging systemsPrashant Prabhat, PhD, and Turan Erdogan, PhD, Semrock Inc., Laser Focus World, January 2010
Discusses additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection
Perfecting TIRF OpticsPrashant Prabhat, PhD, and Turan Erdogan, PhD, Semrock Inc., BioOptics World, Jan/Feb 2009
Discusses additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection
White Paper
TopicDescription
Optical Filters for Laser-based Fluorescence MicroscopesAnalysis of additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection with a focus on multiple-laser systems.
Flatness of Dichroic Beamsplitters Affects Focus and Image QualityAnalysis of how the radius of curvature of a dichroic filter affects focal plane shift, spot size and image fidelity in fluorescence microscopy.
Super-resolution MicroscopyDiscusses advancements in fluorescence microscopy techniques that allow users to break the defraction limit and visualize resolution similar to that of an electron microscope
Application
TopicDescription
TIRF (Total Internal Reflection Fluorescence)An overview of TIRF microscopy, including solutions from Semrock and additional learning resources.
Laser Scanning/Spinning Disk Confocal MicroscopyAn overview of confocal microscopy techniques and applications, including solutions from Semrock and additional learning resources.
Laser-based InstrumentationAn review of common of laser-based instrumentation, including solutions from Semrock and additional learning resources.

405/488/561/710 Di01-T405/488/561/710 T405/488/561/710

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