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442/514/561 nm lasers BrightLine® triple-edge laser-flat dichroic beamsplitter

Part Number: Di01-R442/514/561-25x36

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  • Your filter spectrum may differ slightly from the typical spectrum above, but is certified to meet the optical specifications noted below.
Optical Specifications
SpecificationValue
Reflection Band 1Rabs > 94% 438 – 458 nm
Reflection Band 1 (p-pol)Rabs > 90% 438 – 458 nm
Reflection Band 1 (s-pol)Rabs > 98% 438 – 458 nm
Edge Wavelength 1464 nm
Transmission Band 1Tavg > 93% 469.5 – 496.5 nm
Reflection Band 2Rabs > 94% 509 – 515 nm
Reflection Band 2 (p-pol)Rabs > 90% 509 – 515 nm
Reflection Band 2 (s-pol)Rabs > 98% 509 – 515 nm
Edge Wavelength 2523 nm
Transmission Band 2Tavg > 93% 527.5 – 545 nm
Reflection Band 3Rabs > 94% 559 – 568.2 nm
Reflection Band 3 (p-pol)Rabs > 90% 559 – 568.2 nm
Reflection Band 3 (s-pol)Rabs > 98% 559 – 568.2 nm
Edge Wavelength 3576 nm
Transmission Band 3Tavg > 93% 582 – 800 nm
Laser Wavelengths 1440 +3/-1 nm, 442.0 nm, 457.9 nm
Laser Wavelengths 2505.0 nm, 514.5 nm, 515.0 nm
Laser Wavelengths 3559 +5/-0 nm, 561.4 nm, 568.2 nm

General Filter Specifications
SpecificationValue
Angle of Incidence45 degrees with a shift of 0.35%/degree (40 – 50 degrees)
Cone Half-angle0.5 degrees
Optical Damage Rating2 J/cm2 at 532 nm (for a 532nm filter)
SteepnessSteep
Filter Effective Index1.75 Understanding ‘Effective Index of Refraction’ neff

Physical Filter Specifications (applies to standard sized parts; contact us regarding other sizes)
SpecificationValue
Transverse Dimensions (L x W)25.2 mm x 35.6 mm
Transverse Tolerance± 0.1 mm
Filter Thickness (unmounted)1.05 mm
Filter Thickness Tolerance (unmounted)± 0.05 mm
Clear Aperture≥ 80% (elliptical)
Scratch-Dig60-40
Substrate TypeFused Silica
Substrate Thickness (unmounted)1.05 mm
Substrate Thickness Tolerance (unmounted)± 0.05 mm
OrientationReflective surface marked with part number - Orient in direction of incoming light

Tech Note
TopicDescription
Cleaning Optical FiltersInstructions for cleaning hard coated optical filters
Filter ReliabilityCompares the performance and reliability of hard coated filters to traditional soft-coated filters and provides information about the testing standards for Semrock filters
Flatness of Dichroic BeamsplittersDescribes the impact of non-flat dichroic beamsplitters on microscope image fidelity
Laser Damage ThresholdProvides information for calculating laser damage threshold for pulsed and continuous wave lasers
Multiband Filter Set TerminologyCompares benefits and drawbacks of full multiband, pinkel and sedat filter sets
Optical Filters for Laser-based Fluorescence MicroscopesDiscusses additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection
Journal Article
TopicDescription
Bringing Super-resolution to Fluorescence MicroscopyPrashant Prabhat, PhD, and Turan Erdogan, PhD, Semrock Inc., BioPhotonics, May/June 2010
Advances in fluorescence microscopy techniques allow users to break the defraction limit and visualize resolution similar to that of an electron microscope
Fluorescence Imaging: Optical filters optimize laser-based fluorescence imaging systemsPrashant Prabhat, PhD, and Turan Erdogan, PhD, Semrock Inc., Laser Focus World, January 2010
Discusses additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection
Perfecting TIRF OpticsPrashant Prabhat, PhD, and Turan Erdogan, PhD, Semrock Inc., BioOptics World, Jan/Feb 2009
Discusses additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection
White Paper
TopicDescription
Optical Filters for Laser-based Fluorescence MicroscopesAnalysis of additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection with a focus on multiple-laser systems.
Flatness of Dichroic Beamsplitters Affects Focus and Image QualityAnalysis of how the radius of curvature of a dichroic filter affects focal plane shift, spot size and image fidelity in fluorescence microscopy.
Super-resolution MicroscopyDiscusses advancements in fluorescence microscopy techniques that allow users to break the defraction limit and visualize resolution similar to that of an electron microscope
Application
TopicDescription
TIRF (Total Internal Reflection Fluorescence)An overview of TIRF microscopy, including solutions from Semrock and additional learning resources.
Laser Scanning/Spinning Disk Confocal MicroscopyAn overview of confocal microscopy techniques and applications, including solutions from Semrock and additional learning resources.
Laser-based InstrumentationAn review of common of laser-based instrumentation, including solutions from Semrock and additional learning resources.

442/514/561 Di01-R442/514/561 R442/514/561

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