Welcome, Guest: Login or Register My Cart (0)
Item has been Discontinued. See Other Parts to Consider tab below.

405 nm laser BrightLine® single-edge laser-flat dichroic beamsplitter

Part Number: Di01-R405-25x36

Left-click & drag to zoom. Right-click to save, print or reset

  • Your filter spectrum may differ slightly from the typical spectrum above, but is certified to meet the optical specifications noted below.
Optical Specifications
SpecificationValue
Reflection Band 1Rabs > 94% 372 – 410 nm
Reflection Band 1 (p-pol)Rabs > 90% 372 – 410 nm
Reflection Band 1 (s-pol)Rabs > 98% 372 – 410 nm
Edge Wavelength 1415 nm
Transmission Band 1Tavg > 93% 420.3 – 900 nm
Laser Wavelengths 1375 +/- 3 nm, 405 +/- 5 nm

General Filter Specifications
SpecificationValue
Angle of Incidence45 degrees with a shift of 0.35%/degree (40 – 50 degrees)
Cone Half-angle0.5 degrees
Optical Damage RatingNot Tested
SteepnessSteep

Physical Filter Specifications (applies to standard sized parts; contact us regarding other sizes)
SpecificationValue
Transverse Dimensions (L x W)25.2 mm x 35.6 mm
Transverse Tolerance± 0.1 mm
Filter Thickness (unmounted)1.05 mm
Filter Thickness Tolerance (unmounted)± 0.05 mm
Clear Aperture≥ 80% (elliptical)
Scratch-Dig60-40
Substrate TypeFused Silica
Substrate Thickness (unmounted)1.05 mm
Substrate Thickness Tolerance (unmounted)± 0.05 mm
OrientationReflective surface marked with part number - Orient in direction of incoming light

Revised Filter

Di03-R405.png

405 nm laser BrightLine® single-edge super-resolution / TIRF dichroic beamsplitter

• Laser Dichroic Beamsplitter with edge at 414 nm
• Rabs > 94% 372 – 410 nm
• Ravg > 90% 350 – 372 nm
• Tavg > 93% 417.4 – 1200 nm
• Flatness / RWE: Super-resolution / TIRF


Custom sizing available in less than a week (sizing fee applies).
Part # Di03-R405-t1-25x36
$445
(Non-US pricing info)


[x]
US domestic pricing only. If you are ordering from outside the US, please contact your nearest regional distributor for the correct list price.
Tech Note
TopicDescription
Cleaning Optical FiltersInstructions for cleaning hard coated optical filters
Filter ReliabilityCompares the performance and reliability of hard coated filters to traditional soft-coated filters and provides information about the testing standards for Semrock filters
Flatness of Dichroic BeamsplittersDescribes the impact of non-flat dichroic beamsplitters on microscope image fidelity
Laser Damage ThresholdProvides information for calculating laser damage threshold for pulsed and continuous wave lasers
Optical Filters for Laser-based Fluorescence MicroscopesDiscusses additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection
Journal Article
TopicDescription
Bringing Super-resolution to Fluorescence MicroscopyPrashant Prabhat, PhD, and Turan Erdogan, PhD, Semrock Inc., BioPhotonics, May/June 2010
Advances in fluorescence microscopy techniques allow users to break the defraction limit and visualize resolution similar to that of an electron microscope
Fluorescence Imaging: Optical filters optimize laser-based fluorescence imaging systemsPrashant Prabhat, PhD, and Turan Erdogan, PhD, Semrock Inc., Laser Focus World, January 2010
Discusses additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection
Perfecting TIRF OpticsPrashant Prabhat, PhD, and Turan Erdogan, PhD, Semrock Inc., BioOptics World, Jan/Feb 2009
Discusses additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection
White Paper
TopicDescription
Optical Filters for Laser-based Fluorescence MicroscopesAnalysis of additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection with a focus on multiple-laser systems.
Flatness of Dichroic Beamsplitters Affects Focus and Image QualityAnalysis of how the radius of curvature of a dichroic filter affects focal plane shift, spot size and image fidelity in fluorescence microscopy.
Super-resolution MicroscopyDiscusses advancements in fluorescence microscopy techniques that allow users to break the defraction limit and visualize resolution similar to that of an electron microscope
Application
TopicDescription
TIRF (Total Internal Reflection Fluorescence)An overview of TIRF microscopy, including solutions from Semrock and additional learning resources.
Laser Scanning/Spinning Disk Confocal MicroscopyAn overview of confocal microscopy techniques and applications, including solutions from Semrock and additional learning resources.
Laser-based InstrumentationAn review of common of laser-based instrumentation, including solutions from Semrock and additional learning resources.

Di01-R405

The item has been added to your shopping cart.

The item has been added to your shopping cart, however, your IP address appears to be outside the US/ Canada, so online/ direct orders from Semrock are not allowed. Please see the International Distributor page to find your non-US distributor.

We apologize for any inconvenience.

The shopping cart is offline. Please call toll-free 1-866-SEMROCK (866-736-7625) or email us to place your order.

Selected option not available online. Please call toll-free 1-866-SEMROCK (866-736-7625) or email us to place your order.