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405/488/561/635/800-1050 nm lasers BrightLine® multi-edge multiphoton super-resolution / TIRF dichroic beamsplitter

Part Number: Di01-R405/488/561/635/800-1050-t1-25x36

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  • Your filter spectrum may differ slightly from the typical spectrum above, but is certified to meet the optical specifications noted below.
Optical Specifications
SpecificationValue
Reflection Band 1Rabs > 94% 400 – 410 nm
Reflection Band 1 (p-pol)Rabs > 90% 400 – 410 nm
Reflection Band 1 (s-pol)Rabs > 98% 400 – 410 nm
Edge Wavelength 1420 nm
Transmission Band 1Tavg > 93% 425 – 470 nm
Reflection Band 2Rabs > 94% 483 – 493 nm
Reflection Band 2 (p-pol)Rabs > 90% 483 – 493 nm
Reflection Band 2 (s-pol)Rabs > 98% 483 – 493 nm
Edge Wavelength 2501 nm
Transmission Band 2Tavg > 93% 508 – 540 nm
Reflection Band 3Rabs > 94% 559 – 563 nm
Reflection Band 3 (p-pol)Rabs > 90% 559 – 563 nm
Reflection Band 3 (s-pol)Rabs > 98% 559 – 563 nm
Edge Wavelength 3577 nm
Transmission Band 3Tavg > 93% 583 – 615 nm
Reflection Band 4Rabs > 94% 635 – 647 nm
Reflection Band 4 (p-pol)Rabs > 90% 635 – 647 nm
Reflection Band 4 (s-pol)Rabs > 98% 635 – 647 nm
Edge Wavelength 4662 nm
Transmission Band 4Tavg > 93% 671 – 725 nm
Edge Wavelength 5735 nm
Reflection Band 5Ravg > 94% 800 – 1050 nm
Reflection Band 5 (p-pol)Ravg > 90% 800 – 1050 nm
Reflection Band 5 (s-pol)Ravg > 98% 800 – 1050 nm
Laser Wavelengths 1405 +/- 5 nm
Laser Wavelengths 2488 +/- 5 nm
Laser Wavelengths 3559 +4/-0 nm, 561.4 nm
Laser Wavelengths 4635 +7/-0 nm, 642 +/- 5 nm
Laser Wavelengths 5800 - 1050 nm

General Filter Specifications
SpecificationValue
Angle of Incidence45 degrees with a shift of ~0.35%/degree (40 – 50 degrees)
Cone Half-angle0.5 degrees
Optical Damage Rating1 J/cm² @ 532 nm (10 ns pulse width)
SteepnessStandard
Filter Effective Index1.87 Understanding ‘Effective Index of Refraction’ neff
Group Delay Dispersion± 500 fs² over 800 - 1050 nm reflection band for S-Pol and P-Pol
Flatness / RWE ClassificationSuper-resolution / TIRF
Reflected Wavefront Error (1 mm thickness)< 2.5λ P-V RWE @ 632.8 nm
Reflected Wavefront Error (3 mm thickness)< 0.33λ P-V RWE @ 632.8 nm
Nominal Flatness (1 mm thickness)< 1.4λ P-V per inch @ 632.8 nm
Nominal Flatness (3 mm thickness)< 0.19λ P-V per inch @ 632.8 nm
Maximum Relfected Laser Beam Diameter (1 mm thickness)6 mm
Maximum Relfected Laser Beam Diameter (3 mm thickness)16.7 mm

Physical Filter Specifications (applies to standard sized parts; contact us regarding other sizes)
SpecificationValue
Transverse Dimensions (L x W)25.2 mm x 35.6 mm
Transverse Tolerance± 0.1 mm
Filter Thickness (1 mm, unmounted)1.05 mm
Filter Thickness Tolerance (1 mm, unmounted)± 0.05 mm
Filter Thickness (3 mm, unmounted)3.0 mm
Filter Thickness Tolerance (3 mm, unmounted)± 0.1 mm
Clear Aperture≥ 80% (elliptical)
Scratch-Dig60-40
Substrate TypeFused Silica
Substrate Thickness (1 mm, unmounted)1.05 mm
Substrate Thickness Tolerance (1 mm, unmounted)± 0.05 mm
Substrate Thickness (3 mm, unmounted)3.0 mm
Substrate Thickness Tolerance (3 mm, unmounted)± 0.1 mm
OrientationReflective surface marked with laser dot - Orient in direction of incoming light

Revised Part Number

Di01-R405_488_561_635_800.png

405/488/561/635/800-1050 nm lasers BrightLine® multi-edge multiphoton super-resolution / TIRF dichroic beamsplitter

• Laser Dichroic Beamsplitter with edges at 420 nm, 501 nm, 577 nm, 662 nm & 735 nm
• Rabs > 94% 400 – 410 nm, 483 – 493 nm, 559 – 563 nm & 635 – 647 nm
• Ravg > 94% 800 – 1050 nm
• Tavg > 93% 425 – 470 nm, 508 – 540 nm, 583 – 615 nm & 671 – 725 nm
• Flatness / RWE: Super-resolution / TIRF


Custom sizing available in less than a week (sizing fee applies).
Part # Di01-R405/488/561/635/800-t1-25x36
$895
(Non-US pricing info)


[x]
US domestic pricing only. If you are ordering from outside the US, please contact your nearest regional distributor for the correct list price.
Tech Note
TopicDescription
Cleaning Optical FiltersInstructions for cleaning hard coated optical filters
Filter ReliabilityCompares the performance and reliability of hard coated filters to traditional soft-coated filters and provides information about the testing standards for Semrock filters
Flatness of Dichroic BeamsplittersDescribes the impact of non-flat dichroic beamsplitters on microscope image fidelity
Laser Damage ThresholdProvides information for calculating laser damage threshold for pulsed and continuous wave lasers
Multiband Filter Set TerminologyCompares benefits and drawbacks of full multiband, pinkel and sedat filter sets
Optical Filters for Laser-based Fluorescence MicroscopesDiscusses additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection
Journal Article
TopicDescription
Bringing Super-resolution to Fluorescence MicroscopyPrashant Prabhat, PhD, and Turan Erdogan, PhD, Semrock Inc., BioPhotonics, May/June 2010
Advances in fluorescence microscopy techniques allow users to break the defraction limit and visualize resolution similar to that of an electron microscope
Fluorescence Imaging: Optical filters optimize laser-based fluorescence imaging systemsPrashant Prabhat, PhD, and Turan Erdogan, PhD, Semrock Inc., Laser Focus World, January 2010
Discusses additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection
Perfecting TIRF OpticsPrashant Prabhat, PhD, and Turan Erdogan, PhD, Semrock Inc., BioOptics World, Jan/Feb 2009
Discusses additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection
White Paper
TopicDescription
Optical Filters for Laser-based Fluorescence MicroscopesAnalysis of additional considerations that laser excitation imposes on traditional fluorescence microscopy filter selection with a focus on multiple-laser systems.
Flatness of Dichroic Beamsplitters Affects Focus and Image QualityAnalysis of how the radius of curvature of a dichroic filter affects focal plane shift, spot size and image fidelity in fluorescence microscopy.
Super-resolution MicroscopyDiscusses advancements in fluorescence microscopy techniques that allow users to break the defraction limit and visualize resolution similar to that of an electron microscope
Application
TopicDescription
TIRF (Total Internal Reflection Fluorescence)An overview of TIRF microscopy, including solutions from Semrock and additional learning resources.
Laser Scanning/Spinning Disk Confocal MicroscopyAn overview of confocal microscopy techniques and applications, including solutions from Semrock and additional learning resources.
Laser-based InstrumentationAn review of common of laser-based instrumentation, including solutions from Semrock and additional learning resources.

Di01-R405/488/561/635/800-1050

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